| | 資料類型 | 狀態 | 應還日期 | 預約人數 | 館藏地 | 索書號 | 條碼號 | | 找書 | 圖書 | 在架上 | | 0 | 總館
西文圖書區  | QC611.8.W53 .W36 2018 | W113632 |
| 內容簡介 | This book is an authoritative overview of Wide Bandgap (WBG) device characterization providing essential tools to assist the reader in performing both static and dynamic characterization of WBG devices, particularly those based on using silicon carbide (SiC) and gallium nitride (GaN) power semiconductors. |
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