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   系統號碼933637
   書刊名Recent advances in metrology [electronic resource] : select proceedings of AdMeT 2021 /
   主要著者edited by Sanjay Yadav ... [et al.].
   其他著者Yadav, Sanjay.
   出版項Singapore : Imprint: Springer, 2023.
   索書號QC81
   ISBN9789811924682
   標題Metrology-Congresses.
Electronics and Microelectronics, Instrumentation.
Quantum Measurement and Metrology.
Metrology and Fundamental Constants.
   電子資源https://doi.org/10.1007/978-981-19-2468-2
   叢書名Lecture notes in electrical engineering,v. 9061876-1119 ;;Lecture notes in electrical engineering ;v. 906.1876-1119 ;
   
    
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內容簡介This book presents the select proceedings of the 7th National Conference on Advances in Metrology (AdMet 2021) organized by Maharaja Surajmal Institute of Technology, New Delhi, India. The main theme of the conference was "Sensors and Advance Materials for Measurement and Quality Improvement". The book highlights and discusses the technological developments in the areas of sensor technology, measurement, advance material for industrial application, automation and quality control. This book is aimed for all the personnel engaged in conformity assessment, quality system management, calibration and testing in all sectors of industry. The book will be a valuable reference for metrologists, scientists, engineers, academicians and students from research institutes and industrial establishments to explore the future directions in the areas of sensors, advance materials, measurement and quality improvement.

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